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Records of the ... IEEE International Workshop on Memory Technology, Design, and Testing /

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Bibliographic Details
Corporate Authors: IEEE International Workshop on Memory Technology, Design, and Testing, IEEE Computer Society. Test Technology Technical Committee, IEEE Computer Society. Technical Committee on VLSI, IEEE Solid-State Circuits Council
Format: Conference Proceeding
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society Press.
Subjects:
Semiconductor storage devices > Testing > Congresses.
Random access memory > Congresses.
Online Availability: Check for online availability
Description
Item Description:Evans description based on: 1994.
Physical Description:volumes : illustrations ; 28 cm.
Publication Frequency:Annual
ISSN:1087-4852