Cover Image

Integrating photogrammetric techniques with scene analysis and machine vision III : 21-23 April 1997, Orlando, Florida /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, International Society for Photogrammetry and Remote Sensing
Other Authors: McKeown, David M., McGlone, J. Chris, Jamet, Oliver
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [1997]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 3072.
Subjects:
Computer vision > Congresses.
Photogrammetry > Congresses.
Cartography > Congresses.
Description
Physical Description:xi, 338 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819424870