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Introduction to ID̳D̳Q̳ testing /

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Bibliographic Details
Main Author: Chakravarty, Sreejit
Other Authors: Thadikaran, Paul J.
Format: Book
Language:English
Published: Boston : Kluwer Academic Publishers, [1997]
Series:Frontiers in electronic testing.
Subjects:
Iddq testing.
Digital integrated circuits > Testing.
Integrated circuits > Very large scale integration > Testing.
Description
Item Description:On title page "D̳D̳Q̳" is subscript.
Physical Description:xvii, 322 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0792399455 (acid-free paper)