Demonstration of Ballistic Electron Emission Microscopy / Spectroscopy on the Au/Si (001) system /
barrier heights.
| Main Author: | |
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| Format: | Thesis eBook |
| Language: | English |
| Published: |
[Place of publication not identified] :
[publisher not identified] ;
1997.
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| Subjects: | |
| Online Access: | Link to OAKTrust copy |
| Summary: | barrier heights. been verified. BEEM is used to analyze the characteristics capabilities of a Scanning Tunneling Microscope (STM) have capabilities of BEEM are on a manometer scale. To use BEEM, current model. Comparison between the barrier heights electron emission microscopy and scanning tunneling evaporated gold surface. The barrier heights of the diodes high vacuum STM system and analyzed with BEEM. The ballistic localized barrier heights to be higher than the macroscopic low-noise Au/Si (001) Schottky diodes have been fabricated. microscopy showed some correlation with the topography of the obtained with BEEM and conventional I-V techniques showed the of buried energy barriers and was developed as an extension of scanning tunneling microscopy; hence, the analytical properties using conventional current-voltage (I-V) spectroscopy with the use of a simple one dimensional BEEM techniques. The same diodes were then placed in an ultra- The Ballistic Electron Emission Microscopy (BEEM) The diodes were macroscopically tested for their electrical were extracted from the ballistic electron emission |
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| Item Description: | "Major subject: Electrical Engineering". Vita. |
| Physical Description: | ix, 48 leaves : illustrations ; 28 cm. Also available online. Issued also on microfiche from Lange Micrographics. Numerals are used in title. |
| Bibliography: | Includes bibliographical references. |