Intermediate correlation in proton and anti-proton ionization of helium /

at small impact parameters. At the lowest energies the

Bibliographic Details
Main Author: Bronk, Timothy Edward
Format: Thesis eBook
Language:English
Published: [Place of publication not identified] : [publisher not identified] ; 1996.
Subjects:
Online Access:Link to OAKTrust copy
Description
Summary:at small impact parameters. At the lowest energies the
code in order to obtain converged cross sections for this
Correlation algorithm. We obtain exact results from a one-
Correlation Approximation of Martin and Salin; a no-cut
correlation is more important for proton than anti-proton
cut FIM calculation. In principle the number of cuts needed
differences between the no-cut and one-cut FIM cross sections
double electron ionization cross sections for a bare ion
efficacy of the onecut FIM computer code in this low energy
energy of the projectile is lowered; and it is most important
for anti-proton projectiles down to 12keV have been measured
Forced Impulse Method of Reading and Ford; and a new No-
in the high energy range: 200keV-7MeV/amu. We discover that
is determined only by increasing them until convergence is
lead us to doubt the accuracy of the FIM one-cut method for
obtained but the one-cut version is supposed to be accurate
projectile energies below 200keV. Experimental cross sections
projectile incident on helium is investigated. We calculate
projectiles; its effect on the cross section increases as the
recently been measured. To address these, we test the
reference cross sections in which correlation is deliberately
regime. Results point to the neccessity for a multi-cut FIM
system.
The role of electron-electron correlation in both single and
three reference cross section algorithms: the Frozen
turned off during the collision, and compare them to results
where we have tried to treat correlation exactly. We discuss
Item Description:"Major subject: Physics".
Vita.
Physical Description:viii, 42 leaves : illustrations ; 28 cm.
Also available online.
Issued also on microfiche from Lange Micrographics.
Bibliography:Includes bibliographical references: page 41.