Intermediate correlation in proton and anti-proton ionization of helium /
at small impact parameters. At the lowest energies the
| Main Author: | |
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| Format: | Thesis eBook |
| Language: | English |
| Published: |
[Place of publication not identified] :
[publisher not identified] ;
1996.
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| Subjects: | |
| Online Access: | Link to OAKTrust copy |
| Summary: | at small impact parameters. At the lowest energies the code in order to obtain converged cross sections for this Correlation algorithm. We obtain exact results from a one- Correlation Approximation of Martin and Salin; a no-cut correlation is more important for proton than anti-proton cut FIM calculation. In principle the number of cuts needed differences between the no-cut and one-cut FIM cross sections double electron ionization cross sections for a bare ion efficacy of the onecut FIM computer code in this low energy energy of the projectile is lowered; and it is most important for anti-proton projectiles down to 12keV have been measured Forced Impulse Method of Reading and Ford; and a new No- in the high energy range: 200keV-7MeV/amu. We discover that is determined only by increasing them until convergence is lead us to doubt the accuracy of the FIM one-cut method for obtained but the one-cut version is supposed to be accurate projectile energies below 200keV. Experimental cross sections projectile incident on helium is investigated. We calculate projectiles; its effect on the cross section increases as the recently been measured. To address these, we test the reference cross sections in which correlation is deliberately regime. Results point to the neccessity for a multi-cut FIM system. The role of electron-electron correlation in both single and three reference cross section algorithms: the Frozen turned off during the collision, and compare them to results where we have tried to treat correlation exactly. We discuss |
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| Item Description: | "Major subject: Physics". Vita. |
| Physical Description: | viii, 42 leaves : illustrations ; 28 cm. Also available online. Issued also on microfiche from Lange Micrographics. |
| Bibliography: | Includes bibliographical references: page 41. |