Transient fault modeling and fault injection simulation /
accepted double-exponential transient model. The
| Main Author: | |
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| Format: | Thesis eBook |
| Language: | English |
| Published: |
[Place of publication not identified] :
[publisher not identified] ;
1996.
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| Subjects: | |
| Online Access: | Link to OAKTrust copy |
| Summary: | accepted double-exponential transient model. The An accurate transient fault model is presented in this chance of having a latch error. More importantly, conduct electrical-level fault injection simulations on a data. The model is implemented in a HSPICE simulation derived from the results of a device-level, 3-dimensional, different latch-error patterns are captured from the environment as a current-injection source for fault experimental data indicate that, for a given charge level, is used to extract the numerical model from the empirical microprocessors. The results from the 7-term exponential model are compared with the results from the widely simulation. The current transient model is used to single-event-upset simulation. A curve-fitting algorithm static RAM cell and subcircuits from two commercial target circuits under the new fault model. the 7-term exponential fault model results in a higher thesis. A 7-term exponential current upset model is |
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| Item Description: | "Major subject: Electrical Engineering". Vita. |
| Physical Description: | xi, 86 leaves : illustrations ; 28 cm. Also available online. Issued also on microfiche from Lange Micrographics. |
| Bibliography: | Includes bibliographical references: pages 63-65. |