Streamline simulation of Surfactant Enhanced Aquifer Remediation /

accurate prediction and understanding of SEAR. This study

Bibliographic Details
Main Author:	Tunison, Douglas Irvin, 1961-
Format:	Thesis eBook
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 1996.
Subjects:	Major petroleum engineering.
Online Access:	Link to OAKTrust copy

Description
Summary:	accurate prediction and understanding of SEAR. This study accurate. The new code applies fractional flow theory in and effectiveness over traditional "pump and treat" NAPL anisotropy. The SEAR simulator models mobilization of because of the complex interactions that occur in the close agreement with those predicted by UTCHEM. The conditions. The predictions of the new SEAR simulator show conjunction with streamline theory to predict residual consistent with the effects observed in field applications cumulative production histories. The model is three develops a SEAR computer simulator that is fast, robust, and dimensional and capable of modeling heterogeneity finite difference simulator (UTCHEM) under a variety of groundwater contamination. Surfactant Enhanced Aquifer modeled by constant partition coefficients. The SEAR Nonaqueous Phase Liquids (NAPLS) are a recognized source of relative permeability curves. The solubilization effects are Remediation (SEAR) shows promise in increasing the efficiency remediation processes. Laboratory results are not always residual NAPL through the effects of surfactant on the saturation, saturation distribution, production rate and simulator is compared to a state of the art, high resolution, streamline simulator is orders of magnitude faster than subsurface. Mathematical modeling is required to enable UTCHEM and is ideally suited for screening studies.
Item Description:	"Major subject: Petroleum Engineering". Vita.
Physical Description:	xi, 94 leaves : illustrations ; 28 cm. Also available online. Issued also on microfiche from Lange Micrographics.
Bibliography:	Includes bibliographical references: pages 90-93.