Cover Image

Manufacturing yield evaluation of VLSI/WSI systems /

Bibliographic Details
Other Authors: Ciciani, Bruno
Format: Book
Language:English
Published: Los Alamitos, CA : IEEE Computer Society Press, [1995]
Subjects:
Integrated circuits > Very large scale integration > Design and construction > Data processing.
Integrated circuits > Wafer-scale integration > Design and construction > Data processing.
Integrated circuits > Very large scale integration > Reliability.
Integrated circuits > Wafer-scale integration > Reliability.
Fault-tolerant computing.
Description
Physical Description:x, 437 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references.
ISBN:0818662921