Evaluation of drilled circuit boards using scanning white light interference microscopy /
(indicative of time between drilling holes). ,Experiment I
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| Format: | Thesis eBook |
| Language: | English |
| Published: |
[Place of publication not identified] :
[publisher not identified] ;
1996.
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| Subjects: | |
| Online Access: | Link to OAKTrust copy |
| Summary: | (indicative of time between drilling holes). ,Experiment I addressed the first objective and showed that the SEM is an board hole inspection. The thesis had two experiments to by the SWLIM to the drilling factors speed, chip load, number complete the objective. The first experiment evaluated drilled circuit board holes, but falls short in providing drilled hole's surface. The experiments showed that the drilled holes using both a scanning electron microscope and a drilling parameters using analysis of variance techniques. Electron Microscope (SEM) and a Scanning White Light excellent instrument for initially locating defects in for peak-to-valley roughness (R). Overall, the scanning holes. Interference Microscope (SWLIM) for use in drilled circuit mean value (R,) and the root-mean-square average (Rq). more work to initially identify defects. Experiment 2 number of hits were significant factors for the arithmetic objective of this thesis was to compare the use of a Scanning of panels in a stack. number of hits and head height provides more quantitative data on defects, but can require quantitative depth measurements of the defects. The SWLIM related the quantitative surface texture measurements given scanning white light interference microscope (SWLIM) in order Speed, number of panels, and number of hits were significant statistically related surface texture measurements to SWLIM is a viable inspection tool for drilled circuit board The evaluation of drilled circuit board holes has The experiment showed that chip load, number of panels, and to the SEM in providing quantitative measurements of a to-directly compare the two methods. The second experiment traditionally involved examining the cross-section of a hole using an optical or scanning electron microscope. The white light interference microscope was found to be superior |
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| Item Description: | "Major subject: Mechanical Engineering". Vita. |
| Physical Description: | ix, 135 leaves : illustrations ; 28 cm. Also available online. Issued also on microfiche from Lange Micrographics. |
| Bibliography: | Includes bibliographical references. |