Cover Image

Forensic evidence analysis and crime scene investigation : 20-21 November 1996, Boston, Massachusetts /

Bibliographic Details
Corporate Authors: National Institute of Standards and Technology (U.S.), National Institute of Justice (U.S.), Society of Photo-optical Instrumentation Engineers
Other Authors: Hicks, John, De Forest, Peter R., Baylor, Vivian M.
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [1997]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 2941.
Subjects:
Electronics in criminal investigation > Congresses.
Forensic sciences > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/2941.toc
Description
Physical Description:v, 148 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819423432