APA (7th ed.) Citation

National Institute of Standards and Technology (U.S.), National Institute of Justice (U.S.), Society of Photo-optical Instrumentation Engineers, Hicks, J., De Forest, P. R., & Baylor, V. M. (1997). Forensic evidence analysis and crime scene investigation: 20-21 November 1996, Boston, Massachusetts. SPIE.

Chicago Style (17th ed.) Citation

National Institute of Standards and Technology (U.S.), National Institute of Justice (U.S.), Society of Photo-optical Instrumentation Engineers, John Hicks, Peter R. De Forest, and Vivian M. Baylor. Forensic Evidence Analysis and Crime Scene Investigation: 20-21 November 1996, Boston, Massachusetts. Bellingham, Wash., USA: SPIE, 1997.

MLA (9th ed.) Citation

National Institute of Standards and Technology (U.S.), et al. Forensic Evidence Analysis and Crime Scene Investigation: 20-21 November 1996, Boston, Massachusetts. SPIE, 1997.