Cover Image

High-level test synthesis of digital VLSI circuits /

Bibliographic Details
Main Author: Lee, Mike Tien-Chien
Format: Book
Language:English
Published: Boston : Artech House, [1997]
Series:Artech House solid-state technology library.
Subjects:
Integrated circuits > Very large scale integration > Design and construction > Data processing.
Integrated circuits > Very large scale integration > Testing > Data processing.
Computer-aided design.
Digital integrated circuits > Testing > Data processing.
Description
Physical Description:xi, 220 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references (pages 199-214) and index.
ISBN:0890069077 (alk. paper)