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Polarization analysis and applications to device technology : International Symposium on Polarization Analysis and Applications to Device Technology : 12-14 June, 1996, Yokahama, Japan /

Bibliographic Details
Corporate Authors: International Symposium on Polarization Analysis and Applications to Device Technology Yokahama, Japan, Society of Photo-optical Instrumentation Engineers. Japan Chapter, Society of Photo-optical Instrumentation Engineers, Japan Optical Measuring Instruments Fair
Other Authors: Yoshizawa, Tōru, 1939-, Yokota, Hideshi
Format: Conference Proceeding Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [1996]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 2873.
Subjects:
Polarimetry > Congresses.
Electrooptics > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/2873.toc?SSO=1
Description
Item Description:"This conference was held in conjunction with the 33rd Japan Optical Measuring Instruments Fair ..."--Introduction.
Physical Description:xiii, 350 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819422711