APA (7th ed.) Citation

International Symposium on Polarization Analysis and Applications to Device Technology Yokahama, Japan, Society of Photo-optical Instrumentation Engineers. Japan Chapter, Society of Photo-optical Instrumentation Engineers, Japan Optical Measuring Instruments Fair, Yoshizawa, T., & Yokota, H. (1996). Polarization analysis and applications to device technology: International Symposium on Polarization Analysis and Applications to Device Technology : 12-14 June, 1996, Yokahama, Japan. SPIE.

Chicago Style (17th ed.) Citation

International Symposium on Polarization Analysis and Applications to Device Technology Yokahama, Japan, Society of Photo-optical Instrumentation Engineers. Japan Chapter, Society of Photo-optical Instrumentation Engineers, Japan Optical Measuring Instruments Fair, Tōru Yoshizawa, and Hideshi Yokota. Polarization Analysis and Applications to Device Technology: International Symposium on Polarization Analysis and Applications to Device Technology : 12-14 June, 1996, Yokahama, Japan. Bellingham, Wash., USA: SPIE, 1996.

MLA (9th ed.) Citation

International Symposium on Polarization Analysis and Applications to Device Technology Yokahama, Japan, et al. Polarization Analysis and Applications to Device Technology: International Symposium on Polarization Analysis and Applications to Device Technology : 12-14 June, 1996, Yokahama, Japan. SPIE, 1996.