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Electrical Overstress/Electrostatic Discharge Symposium proceedings /

Bibliographic Details
Corporate Authors: Electrical Overstress/Electrostatic Discharge Symposium, IIT Research Institute, Reliability Analysis Center (U.S.), EOS/ESD Association
Format: Conference Proceeding
Language:English
Published: Griffiss AFB, NY : Reliability Analysis Center, [1980-]
Subjects:
Electronic apparatus and appliances > Protection > Congresses.
Electric discharges > Congresses.
Electrostatics > Congresses.
Online Availability: Check for online availability
Description
Published:EOS-1 (1979)-
Item Description:Evans description based on: 17th (1995).
Physical Description:volumes : illustrations ; 28 cm.
Publication Frequency:Annual
Bibliography:Includes bibliographical references.
ISSN:0739-5159