Refinement of a semi-empirical model for the microwave emissivity of the sea surface as a function of wind speed /

30% of the roughness at 6.6 GHz. The last change to the

Bibliographic Details
Main Author: Kohn, David Jacob
Format: Thesis eBook
Language:English
Published: [Place of publication not identified] : [publisher not identified] ; 1995.
Subjects:
Online Access:Link to OAKTrust copy
Description
Summary:30% of the roughness at 6.6 GHz. The last change to the
An increase in roughness is needed at frequencies above 16.6
atmospheric variables. These algorithms can then be used to
back into the view path of the microwave sensor. This change
brightness temperatures are used to obtain algorithms for
changes yield an improved sea surface model that is within 2%
emissivity functions.
emissivity right. Several changes are made to Wilheit's sea
for microwave frequencies. This model is used in a radiative
GHz and a decrease below 16.6 GHz. The roughness is
In 1979, Wilheit introduced a sea surface emissivity model
increased to 132% of the Cox and Munk roughness at 37 GHz and
increases- instead of being switched on at 7 m/s. These
lowered the computed emissivity of the sea surface-, which is
measurements- Therefore, it is important to get the surface
model is in the treatment of sea foam. The foam effect is
more representative of observations without sea foam. The
now a smooth transition of increasing foam as the wind speed
of the sea surface emissivity given by the Wentz sea surface
reflections are now treated as if the radiation is reflected
retrieve atmospheric variables from the microwave
second change is made to the sea surface roughness parameter.
surface emissivity model. The first change to the model is
temperatures for various atmospheric conditions. The
to the model's treatment of multiple reflections. Multiple
transfer model (RTM) to obtain simulated brightness
Item Description:"Major subject: Meteorology".
Vita.
Physical Description:viii, 44 leaves : illustrations ; 28 cm.
Also available online.
Issued also on microfiche from Lange Micrographics.
Bibliography:Includes bibliographical references.