Optical characterization of epitaxial semiconductor layers /
| Other Authors: | , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Berlin ; New York :
Springer-Verlag,
[1996]
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| Subjects: |
| Physical Description: | xiv, 429 pages : illustrations ; 24 cm. |
|---|---|
| Bibliography: | Includes bibliographical references (pages [393]-422) and index. |
| ISBN: | 354059129X (hardcover : alk. paper) |