Cover Image

Machine vision applications in industrial inspection IV : 31 January-1 February, 1996, San Jose, California /

Bibliographic Details
Corporate Authors: IS & T--the Society for Imaging Science and Technology, Society of Photo-optical Instrumentation Engineers
Other Authors: Ravishankar Rao, A., Zhang, Ning
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [1996]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 2665.
Subjects:
Quality control > Optical methods > Automation > Congresses.
Computer vision > Congresses.
Engineering inspection > Congresses.
Description
Physical Description:vii, 284 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819420395