rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Proceedings
    sub title: International Conference on the Economics of Design, Test, and Manufacturing
  title info:
    title: International Conference on the Economics of Design, Test, and Manufacturing
  name:
    name part: International Conference on the Economics of Design, Test, and Manufacturing.
    role:
      role term: creator
  name:
    name part: IEEE Computer Society
    name part: Test Technology Technical Committee.
  type of resource: text
  genre: conference publication
  origin info:
    place:
      place term: cau
    date issued: 19uu
    date issued: 199u
    issuance: continuing
  language:
    language term: eng
  physical description:
    form: print
    extent: volumes : illustrations ; 29 cm.
  note: sponsored by IEEE Computer Society Technical Committee for Test Technology.
  note: Description based on: 3rd (May 16-17, 1994).
  note: Title from cover.
  subject:
    geographic code: n-us---
  subject:
    topic: Electronic circuits
    topic: Testing
    topic: Congresses
  subject:
    topic: Electronic circuit design
    genre: Congresses
  record info:
    record content source: VPI
    record creation date: 960624
    record change date: 20151005062047.0
    record identifier: in00001308585