rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Reflection electron microscopy and spectroscopy for surface analysis
  name:
    name part: Wang, Zhong Lin.
    role:
      role term: creator
  type of resource: text
  genre: bibliography
  origin info:
    place:
      place term: enk
    date issued: 1996
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: xix, 436 pages : illustrations ; 26 cm.
  note: Zhong Lin Wang.
  note: "A bibliography of REM, SREM and REELS: pages 403-418."
  note: Includes bibliographical references (pages 419-430) and indexes.
  subject:
    topic: Materials
    topic: Microscopy
  subject:
    topic: Surfaces (Technology)
    topic: Analysis
  subject:
    topic: Reflection electron microscopy
  classification: TA417.23 .W36 1996
  classification: 620/.44
  identifier: 0521482666
  identifier: 95033552
  record info:
    record content source: DLC
    record creation date: 950816
    record change date: 20151005060418.0
    record identifier: in00001308272