Cover Image

Reflection electron microscopy and spectroscopy for surface analysis /

Bibliographic Details
Main Author: Wang, Zhong Lin
Format: Book
Language:English
Published: Cambridge [England] ; New York : Cambridge University Press, 1996.
Subjects:
Materials > Microscopy.
Surfaces (Technology) > Analysis.
Reflection electron microscopy.
Description
Physical Description:xix, 436 pages : illustrations ; 26 cm.
Bibliography:"A bibliography of REM, SREM and REELS: pages 403-418."
Includes bibliographical references (pages 419-430) and indexes.
ISBN:0521482666