Charge neutralization processes between highly charged ions and surfaces /
The interaction of highly charged ions with surfaces causes the emission of secondary electrons. Measurements have been made of the electron emissions from Ag and NaCl targets, due to bombardment with multiply charge Ar ions. Ions beams that were used areAr+2 , Ar +4 , Ar +6 , Ar+8, and Ar+9 at 24...
| Main Author: | |
|---|---|
| Format: | Thesis Book |
| Language: | English |
| Published: |
[Place of publication not identified] :
[publisher not identified] ;
1994.
|
| Subjects: | |
| Online Access: | Link to OAKTrust copy http://proxy.library.tamu.edu/login?url=http://proquest.umi.com/pqdweb?did=741964811&sid=1&Fmt=2&clientId=2945&RQT=309&VName=PQD |
| Summary: | The interaction of highly charged ions with surfaces causes the emission of secondary electrons. Measurements have been made of the electron emissions from Ag and NaCl targets, due to bombardment with multiply charge Ar ions. Ions beams that were used areAr+2 , Ar +4 , Ar +6 , Ar+8, and Ar+9 at 24 keV, Ar +4 1 Ar +6 Ar +8, Ar+9, and Ar+ll at 48 keV, and Ar +8 , Ar+91 Ar+ll I and Ar+13 at 96 keV. Energy spectra of the emitted electrons reveal Ag M Augers and Ar L Augers for the silver target, and Cl L Augers and Ar L Augers (only for high charge states) for the NaCl target. |
|---|---|
| Item Description: | Vita. "Major Subject: Physics". |
| Physical Description: | xi, 125 leaves : illustrations ; 28 cm. Issued also on microfiche from University Microfilms Inc. |
| Bibliography: | Includes bibliographical references. |