Twelfth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : March 5-7, 1996, Four Seasons Hotel, Austin, TX, USA /

Bibliographic Details
Corporate Authors: IEEE Semiconductor Thermal Measurement and Management Symposium Austin, Texas, Components, Packaging & Manufacturing Technology Society
Format: Conference Proceeding Book
Language:English
Published: New York, NY, U.S.A. : Piscataway, NJ, USA : IEEE ; May be purchased from IEEE Service Center, [1996]
Subjects:
Description
Item Description:"IEEE catalog number 96CH35890"--Title page verso.
Physical Description:xiii, 251 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references.
ISBN:0780331397 (softbound ed.)
0780331400 (casebound ed.)
0780331419 (microfiche ed.)