A modified version of BILBO for faster testing of pipeline structure circuits /

a few gates to a bidirectional multiple-input signature

Bibliographic Details
Main Author: Lee, Jungran, 1967-
Format: Thesis eBook
Language:English
Published: [Place of publication not identified] : [publisher not identified] ; 1994.
Subjects:
Online Access:Link to OAKTrust copy
Description
Summary:a few gates to a bidirectional multiple-input signature
are sampled and coded on-line at the rated internal speed of
feedback shift registers are successfully used for detecting
Parallel signature analysis with bidirectional multiple-input
points is gathered without putting an additional burden on
points on complex digital ICs to be observed. The test data
register, a multifunctional logic subsystem is obtained,
signature registers allows the data flow at internal test
single stuck-at faults in a combinational circuit. By adding
structure circuits, testing time is reduced by almost half
techniques. When this structure is applied to pipelined
that of previous schemes.
the high speed data transfer between the ICs under test and
the ICs. The information about the data flow at the test
the tester. Pseudorandom test patterns generated with linear
which combines the advantages of builtin test and scan path
Item Description:"Major subject: Electrical Engineering".
Vita.
Physical Description:x, 52 leaves : illustrations ; 28 cm.
Also available online.
Bibliography:Includes bibliographical references.