rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Testability concepts for digital ICs
    sub title: the macro test approach
  name:
    name part: Beenker, F. P. M. (Frans P. M.)
    role:
      role term: creator
  name:
    name part: Bennetts, R. G.
  name:
    name part: Thijssen, A. P.
  type of resource: text
  origin info:
    place:
      place term: ne
    date issued: 1995
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: ix, 212 pages : illustrations ; 25 cm.
  note: by F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen.
  note: Includes bibliographical references (pages 197-205) and index.
  subject:
    topic: Digital integrated circuits
    topic: Testing
  subject:
    topic: Automatic test equipment
  classification: TK7874.65 .B44 1996
  classification: 621.3815/48
  related item:
    title info:
      title: Frontiers in electronic testing ; 3
  identifier: 0792396588 (hardcover : alk. paper)
  identifier: 95040166
  record info:
    record content source: DLC
    record creation date: 950926
    record change date: 20151004093227.0
    record identifier: in00001288197