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Defect and fault tolerance in VLSI systems.

Bibliographic Details
New Title:	International Workshop on Defect and Fault Tolerance in VLSI Systems Proceedings
Corporate Author:	International Workshop on Defect and Fault Tolerance in VLSI Systems
Format:	Conference Proceeding
Language:	English
Published:	New York : Plenum Press, ©1989-©1990.
Subjects:	Integrated circuits > Very large scale integration > Design and construction > Congresses. Fault-tolerant computing > Congresses.
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