Cover Image

Defect and fault tolerance in VLSI systems.

Bibliographic Details
New Title:International Workshop on Defect and Fault Tolerance in VLSI Systems Proceedings
Corporate Author: International Workshop on Defect and Fault Tolerance in VLSI Systems
Format: Conference Proceeding
Language:English
Published: New York : Plenum Press, ©1989-©1990.
Subjects:
Integrated circuits > Very large scale integration > Design and construction > Congresses.
Fault-tolerant computing > Congresses.
Online Availability: Check for online availability
Description
Published:Vol. 1-v. 2.
Item Description:Proceedings of the 1988-1989 International Workshop on Defect and Fault Tolerance in VLSI Systems.
Title from cover.
Physical Description:volumes : illustrations ; 26 cm.
Publication Frequency:Annual
ISSN:1055-9329
1063-6722