Proceedings : International Test Conference 1995.

Bibliographic Details
Corporate Authors:	International Test Conference Washington, D.C., IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format:	Conference Proceeding Book
Language:	English
Published:	Altoona, PA : The Conference, ©1995.
Subjects:	Integrated circuits > Testing > Congresses. Electronic digital computers > Circuits > Testing > Congresses. Telecommunication > Equipment and supplies > Testing > Congresses. Electronic digital computers > Circuits > Testing. Integrated circuits > Testing. Essais (technologie) > Congrès. Conference papers and proceedings.
Online Access:	IEEE Xplore IEEE Xplore

Description
Item Description:	"October 21-25, 1995 ... Washington, D.C., USA"--Cover. "Sponsored by IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section"--Cover. "IEEE catalog number 95CH35858"--Title page verso.
Physical Description:	xii 1011 pages : illustrations ; 28 cm Also available via the World Wide Web with additional title: Test Conference, 1995, proceedings, International.
Bibliography:	Includes bibliographical references and index.
ISBN:	0780329929 9780780329928 0780329910 9780780329911 0780329937 9780780329935