Standards for electronic imaging technologies, devices, and systems : proceedings of a conference held 1-2 February 1996, San Jose, California /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Nier, Michael
Format: Book
Language:English
Published: Bellingham, Wash. : SPIE Optical Engineering Press, [1996]
Series:Critical reviews of optical science and technology ; v. CR61.
Subjects:
Description
Item Description:"Sponsored by SPIE Press."
Physical Description:vii, 276 pages : illustrations ; 26 cm.
Bibliography:Includes bibliographical references.
ISBN:0819420166 (hc)