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International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics : [proceedings] 11-13 May, 1995, Kiev, Ukraine /

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Bibliographic Details
Corporate Authors: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics Kiev, Ukraine, International Association of the Academies of Sciences, Society of Photo-optical Instrumentation Engineers. Ukraine Chapter
Other Authors: Svechnikov, Sergeĭ Vasil'evich, Valakh, M. I͡A. (Mikhail I͡Akovlevich)
Format: Conference Proceeding Book
Language:English
Published: Bellingham, Wash. : SPIE, [1995]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 2648.
Subjects:
Optical materials > Reliability > Congresses.
Optical materials > Testing > Congresses.
Electronics > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/2648.toc
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