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Bibliographic Details
New Title:Autotestcon. IEEE Autotestcon proceedings
Previous Title:Autotestcon. Conference proceedings
Corporate Authors: Autotestcon, Institute of Electrical and Electronics Engineers, IEEE Instrumentation and Measurement Society, IEEE Aerospace and Electronic Systems Society
Format: Conference Proceeding
Language:English
Published: [New York, N.Y.] : Institute of Electrical and Electronics Engineers, ©1995-©1996.
Subjects:
Automatic test equipment > Congresses.
Maintainability (Engineering) > Congresses.
Avionics > Congresses.
Testing > Data processing > Congresses.
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Description
Published:1995-1996.
Item Description:Each volume has also a distinctive title.
"IEEE catalog number: 95CH35786"--Title page verso.
Theme: "Systems readiness: test technology for the 21st century."
Physical Description:2 volumes : illustrations ; 28 cm.
Publication Frequency:Annual
ISSN:1088-7725