Micromachined devices and components : 23-24 October, 1995, Austin, Texas /

Bibliographic Details
Corporate Authors: Semiconductor Equipment and Materials International, Society of Photo-optical Instrumentation Engineers, National Institute of Standards and Technology (U.S.)
Other Authors: Roop, Ray, Chau, Kevin
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [1995]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 2642.
Subjects:
Description
Physical Description:ix, 296 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819420085
9780819420084