Three-dimensional and unconventional imaging for industrial inspection and metrology : 23-25 October 1995, Philadelphia, Pennsylvania /
| Corporate Author: | |
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| Other Authors: | , , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
[1996]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 2599. |
| Subjects: |
| Physical Description: | viii, 420 pages : illustrations ; 28 cm. |
|---|---|
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 081941963X |