Materials reliability in microelectronics IV : symposium held April 5-8, 1994, San Francisco, California, U.S.A. /

Bibliographic Details
Corporate Author:	Materials Research Society. Fall Meeting
Other Authors:	Børgesen, Peter
Format:	Book
Language:	English
Published:	Pittsburgh, Pa. : Materials Research Society, [1994]
Series:	Materials Research Society symposia proceedings.
Subjects:	Microelectronics > Reliability > Congresses. Microelectronics > Materials > Testing > Congresses. Electrodiffusion > Congresses.

Description
Physical Description:	xv, 630 pages : illustrations ; 24 cm.
Bibliography:	Includes bibliographical references and indexes.
ISBN:	1558992383
ISSN:	0272-9172 ;