APA (7th ed.) Citation

National Semiconductor Metrology Program (U.S.), National Institute of Standards and Technology (U.S.), National Institute of Standards and Technology (U.S.). Office of Microelectronics Programs, & Electronics and Electrical Engineering Laboratory (National Institute of Standards and Technology). (1995). National Semiconductor Metrology Program: [catalog]. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology.

Chicago Style (17th ed.) Citation

National Semiconductor Metrology Program (U.S.), National Institute of Standards and Technology (U.S.), National Institute of Standards and Technology (U.S.). Office of Microelectronics Programs, and Electronics and Electrical Engineering Laboratory (National Institute of Standards and Technology). National Semiconductor Metrology Program: [catalog]. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1995.

MLA (9th ed.) Citation

National Semiconductor Metrology Program (U.S.), et al. National Semiconductor Metrology Program: [catalog]. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1995.