Cover Image

Near-field optics : 9-10 July, 1995, San Diego, California /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Paesler, Michael A., Moyer, Patrick J.
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [1995]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 2535.
Subjects:
Scanning probe microscopy > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/2535.toc
Description
Physical Description:vii, 162 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819418943