Time-resolved electron and X-ray diffraction : 13-14 July, 1995, San Diego, California /
| Corporate Author: | |
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
[1995]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 2521. |
| Subjects: | |
| Online Access: | https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/2521.toc |
| Physical Description: | ix, 318 pages : illustrations ; 28 cm. |
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| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0819418803 |