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Bibliographic Details
New Title:Autotestcon. Conference record (1995). Conference record
Previous Title:Autotestcon. Proceedings (1993). Proceedings
Corporate Authors: Autotestcon, Institute of Electrical and Electronics Engineers, IEEE Instrumentation and Measurement Society, IEEE Aerospace and Electronic Systems Society
Format: Conference Proceeding
Language:English
Published: [New York, N.Y.] : Institute of Electrical and Electronics Engineers, [1994]
Subjects:
Automatic test equipment > Congresses.
Maintainability (Engineering) > Congresses.
Avionics > Congresses.
Testing > Data processing > Congresses.
Description
Published:1994.
Item Description:Some volumes have also a distinctive title.
"IEEE catalog number: 93CH3436-3"--Title page verso.
"It's Autotestcon's 30th Anniversary!"--cover.
Physical Description:1 volume : illustrations ; 28 cm.
Publication Frequency:Annual