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Iddq testing for CMOS VLSI /

Bibliographic Details
Main Author: Rajsuman, Rochit
Format: Book
Language:English
Published: Boston : Artech House, [1995]
Series:Artech House optoelectronics library.
Subjects:
Iddq testing.
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Testing
Description
Physical Description:xii, 193 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references (pages 181-185) and index.
ISBN:0890067260