rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Influence of temperature on microelectronics and system reliability
  name:
    name part: Lall, Pradeep.
    role:
      role term: creator
  name:
    name part: Pecht, Michael.
  name:
    name part: Hakim, Edward B.
  type of resource: text
  genre: bibliography
  origin info:
    place:
      place term: flu
    date issued: 1997
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: 307 pages : illustrations ; 26 cm.
  note: Pradeep Lall, Michael G. Pecht, Edward B. Hakim.
  note: Includes bibliographical references and index.
  subject:
    topic: Microelectronics
    topic: Materials
    topic: Thermal properties
  subject:
    topic: Electronic packaging
  subject:
    topic: Electronic apparatus and appliances
    topic: Reliability
  classification: TK7870.25 .L35 1997
  classification: 621.381/046
  related item:
    title info:
      title: Electronic packaging series
  identifier: 0849394503 (acid-free paper)
  identifier: 96039038
  record info:
    record content source: DLC
    record creation date: 960923
    record change date: 20151003062331.0
    record identifier: in00001237160