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Atomic force microscopy/scanning tunneling microscopy /

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Bibliographic Details
Corporate Author: U.S. Army Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium
Other Authors: Cohen, Samuel H., Bray, Mona T., Lightbody, Marcia L.
Format: Conference Proceeding Book
Language:English
Published: New York : Plenum Press, [1994]
Subjects:
Atomic force microscopy.
Scanning tunneling microscopy.
Microscopy
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Published 1994
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