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Atomic force microscopy/scanning tunneling microscopy /

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Bibliographic Details
Corporate Author: U.S. Army Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium
Other Authors: Cohen, Samuel H., Bray, Mona T., Lightbody, Marcia L.
Format: Conference Proceeding Book
Language:English
Published: New York : Plenum Press, [1994]
Subjects:
Atomic force microscopy.
Scanning tunneling microscopy.
Microscopy
Description
Item Description:"Proceedings of the First U.S. Army Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 8-10, 1993, in Natick, Massachusetts"--Title page verso.
Physical Description:x, 453 pages : illustrations ; 26 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0306448904