Image based measurement systems : object recognition and parameter estimation /

Bibliographic Details
Main Author:	Heijden, Ferdinand van der
Format:	Book
Language:	English
Published:	Chichester ; New York : Wiley, [1994]
Subjects:	Image processing. Computer vision. Pattern recognition systems. Parameter estimation. Image processing > Use of > Computers

Description
Physical Description:	viii, 338 pages, 2 unnumbered pages of plates : illustrations ; 26 cm.
Bibliography:	Includes bibliographies and index.
ISBN:	0471950629 :