rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: IEEE VLSI Test Symposium
    sub title: digest of papers
  title info:
    title: IEEE VLSI Test Symposium
  title info:
    title: IEEE test symposium
  title info:
    title: Proceedings
  name:
    name part: IEEE VLSI Test Symposium.
    role:
      role term: creator
  name:
    name part: Institute of Electrical and Electronics Engineers
    name part: Philadelphia Section.
  name:
    name part: IEEE Computer Society
    name part: Test Technology Committee.
  name:
    name part: IEEE Test Symposium.
  type of resource: text
  origin info:
    place:
      place term: nju
    date issued: 1990
    date issued: 9999
    issuance: continuing
  language:
    language term: eng
  physical description:
    form: print
    extent: volumes : illustrations ; 28 cm.
  note: Description based on: 12th (1994).
  note: 1995- Proceedings
  note: Some volumes also have a distinctive title.
  note: Title from cover.
  subject:
    topic: Application-specific integrated circuits
    topic: Congresses
  subject:
    topic: Integrated circuits
    topic: Very large scale integration
    topic: Testing
    topic: Congresses
  related item:
    title info:
      title: IEEE VLSI test workshop
  record info:
    record content source: EYM
    record creation date: 941103
    record change date: 20151003051115.0
    record identifier: in00001227517