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Integrated circuit quality and reliability /

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Bibliographic Details
Main Author: Hnatek, Eugene R.
Format: Book
Language:English
Published: New York : M. Dekker, [1995]
Edition:2nd ed., rev. and expanded.
Series:Electrical engineering and electronics ; 91.
Subjects:
Integrated circuits > Reliability.
Description
Physical Description:786 pages : illustrations
Bibliography:Includes bibliographical references and index.
ISBN:0824792831 (acid-free paper)