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mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Mass spectrometric analysis with cluster projectiles and coincidence counting
  name:
    name part: Cox, Bedford Dwain
    name part: 1966-
    role:
      role term: creator
  name:
    name part: Schweikert, Emile A.
    role:
      role term: degree supervisor.
  name:
    name part: Hart, Ron
    role:
      role term: degree committee member.
  name:
    name part: Russell, David
    role:
      role term: degree committee member.
  name:
    name part: Soriaga, Manuel
    role:
      role term: degree committee member.
  name:
    name part: Texas A & M University
    role:
      role term: degree granting institution.
  type of resource: text
  genre: bibliography
  genre: Academic theses
  origin info:
    place:
      place term: xx
    date issued: 1992
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: xiv, 120 leaves : illustrations ; 28 cm
  abstract: Methods for maximizing the amount of secondary ion information, per primary projectile, are described. The method is based on time-of-flight mass spectrometry and event-by-event coincidence counting. Each projectile in a secondary ion mass spectrometry experiment is essentially a nano-probe of the surface. Coincidence counting takes advantage of this fact by analyzing the results of each event individually. This type of event-by-event analysis is the only way to insure that the secondary ion chemical and spatial information is preserved. The information obtained from coincidence counting time-of-flight mass spectrometry includes: a) surface com position, b) relative concentrations, and c) degree of intermolecular mixing. The technique was applied to the study of an important new class of polymers: polymer blends. Secondary ion mass spectrometry, when applied to the analysis of synthetic polymers, induces backbone fragmentation which is characteristic of the homopolymer. The characteristic "fingerprint" peaks from polystyrene and poly(vinyl methyl ether) were used to identify the presence of these two polymers in a polymer blend. The percent coincidence between the characteristic secondary ions from each component of the blend were used to determine both the relative concentration and the degree of molecular mixing. Results indicate molecular segregation of the two polymers on the film surface. The largest degree of segregation was determined for the phase separated blends. The performance of this technique depends on the desorption efficiency of the primary projectiles. In practice then, one seeks primary ions which are surface sensitive, have controllable parameters such as size, velocity, and charge state, and generate high secondary ion yields. Focus was placed on the use of keV organic cluster projectiles to meet these criteria. Of particular interest to this study were C[18] (chrysene), C[24] (coronene), and C[60] (buckminster-fullerene). Results indicate enhan…
  note: Vita.
  note: "Major subject: Chemistry."
  note: Includes bibliographical references.
  note: Ph. D. Texas A & M University 1992
  subject:
    topic: Secondary ion mass spectrometry
  subject:
    topic: Mass spectrometry
  subject:
    topic: Instrumental analysis
  subject:
    topic: Time-of-flight mass spectrometry
  subject:
    topic: Buckminsterfullerene
  subject:
    topic: Major chemistry
  identifier: http://proxy.library.tamu.edu/login
  related item:
    location:
      url: http://proxy.library.tamu.edu/login
  record info:
    record content source: TXA
    record creation date: 941122
    record change date: 20200904152616.0
    record identifier: in00001212317
    language of cataloging:
      language term: eng