Scanning force microscopy : with applications to electric, magnetic, and atomic forces /
| Main Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
New York :
Oxford University Press,
1994.
|
| Edition: | Rev. ed. |
| Series: | Oxford series in optical and imaging sciences ;
5. |
| Subjects: |
| Physical Description: | xiii, 263 pages : illustrations ; 24 cm. |
|---|---|
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 019509204X |