IEEE Workshop on Visualization and Machine Vision : proceedings, June 24, 1994, Seattle, Washington /

Bibliographic Details
Corporate Authors: IEEE Workshop on Visualization and Machine Vision Seattle, Wash., IEEE Computer Society. Technical Committee on Pattern Analysis and Machine Intelligence, IEEE Computer Society. Technical Committee--Computer Graphics
Format: Conference Proceeding Book
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society Press, [1994]
Subjects:
Description
Item Description:"IEEE Computer Society Press Order Number 5875-02"--Title page verso.
"IEEE Catalog Number 94TH0636-1"--Title page verso.
Physical Description:vi, 110 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0818658754 (paper)
0818658762 (microfiche)