Amplitude and intensity spatial interferometry II : 15-16 March 1994, Kona, Hawaii /
| Corporate Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
[1994]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 2200. |
| Subjects: | |
| Online Access: | https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/2200.toc |
| Physical Description: | xi, 612 pages : illustrations ; 28 cm. |
|---|---|
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0819414956 |