Interferometry VI--applications : 14-15 July 1993, San Diego, California /
| Corporate Authors: | , |
|---|---|
| Other Authors: | , , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
[1994]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 2004. |
| Subjects: |
| Physical Description: | ix, 362 pages : illustrations ; 28 cm. |
|---|---|
| Bibliography: | Includes bibliographical references and index. |